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2012 International ESD Workshop
May 14-17, 2012
Priory Corsendonk, Oud-Turnhout, Belgium
Invited Talk 1
Advancing CMOS Beyond the Si Roadmap:
Chronicle of a (R)evolution Foretold
Marc Heyns, imec, Katholieke Universiteit Leuven
Invited Talk 2
Smart Power Technology on SOI
Piet Wessels, NXP Semiconductors
Invited Talk 3
ESDA Advanced Topic Ad-Hoc Working Group on
Electrical Overstress EOS
Invited Talk 4
System Level EMC/ESD Design –
Challenges and Opportunities
Pasi Tamminen, NOKIA Corporation
Seminar 1
Electrical Overstress (EOS) of Automotive Semiconductors
-- Root Causes and Conclusions
Christoph Thienel, Robert Bosch GmbH
Seminar 2
EOS / ESD Related Product Failure Analysis
Peter Egger, Infineon Technologies AG
Seminar 3
ESD Protection in FinFET Technologies
Steven Thijs, imec
Seminar 4
ESD Design in High Voltage Technologies
Joost Willemen, Infineon Technologies AG;
Lorenzo Cerati, STMicroelectronics
Seminar 5
Bridging the Gap Between IC Design and its Application
Mart Coenen, EMCMCC
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